Publication Beamlines Strategic Pillar
Motamedi, Pouyan; Bosnick, Ken; Cadien, Ken; Hogan, James D. (2018). In Situ Synchrotron X-Ray Diffraction Analysis of Phase Transformation in Epitaxial Metastable hcp Nickel Thin Films, Prepared via Plasma-Enhanced Atomic Layer Deposition. Advanced Materials Interfaces 5(24) , 1800957. 10.1002/admi.201800957. IDEAS Materials