Publication Beamlines Strategic Pillar
Achkar, A. J.; Sutarto, R.; Mao, X.; He, F.; Frano, A. et al. (2012). Distinct Charge Orders in the Planes and Chains of Ortho-III-OrderedYBa2Cu3O6+δSuperconductors Identified by Resonant Elastic X-ray Scattering. Physical Review Letters 109(16) . 10.1103/physrevlett.109.167001. REIXS
Choi, Woo Seok; Kwon, Ji-Hwan; Jeen, Hyoungjeen; Hamann-Borrero, Jorge E.; Radi, Abdullah et al. (2012). Strain-Induced Spin States in Atomically Ordered Cobaltites. Nano Letters 12(9) , 4966-4970. 10.1021/nl302562f. REIXS
Ghiringhelli, G.; Le Tacon, M.; Minola, M.; Blanco-Canosa, S.; Mazzoli, C. et al. (2012). Long-Range Incommensurate Charge Fluctuations in (Y,Nd)Ba 2 Cu 3 O 6+ x . Science 337(6096) , 821-825. 10.1126/science.1223532. REIXS
Gray, A. X.; Janotti, A.; Son, J.; LeBeau, J. M.; Ueda, S. et al. (2011). Insulating state of ultrathin epitaxial LaNiO3thin films detected by hard x-ray photoemission. Physical Review B - Condensed Matter and Materials Physics 84(7) . 10.1103/physrevb.84.075104. REIXS
Hawthorn, D. G.; He, F.; Venema, L.; Davis, H.; Achkar, A. J. et al. (2011). An in-vacuum diffractometer for resonant elastic soft x-ray scattering. Review of Scientific Instruments 82(7) , 073104. 10.1063/1.3607438. REIXS
Li, Y.S.; Yang, L.; Tang, Y.; Zhang, C.; Zhang, L. et al. (2011). Adherent nanocrystalline diamond coatings deposited on Ti substrate at moderate temperatures. Surface and Coatings Technology 206(7) , 1971-1976. 10.1016/j.surfcoat.2011.09.077. REIXS, SXRMB, VESPERS
Li, J. W.; Matias, E.; Chen, N.; Kim, C.-Y.; Wang, J. et al. (2010). Investigations of mechanical vibrations for beamlines at the Canadian Light Source. Journal of Synchrotron Radiation 18(2) , 109-116. 10.1107/s0909049510041075. CMCF-ID, REIXS, SM Materials
Kaznacheyev, K.V.; Karunakaran, Ch.; He, F.; Sigrist, M.; Summers, T. et al. (2007). CLS ID-10 chicane configuration: From “Simple Sharing” to extended performance with high-speed polarization switching. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 103-106. 10.1016/j.nima.2007.08.082. REIXS, SM