Publication Beamlines Strategic Pillar
de Boer, Tristan; Häusler, Jonas; Strobel, Philipp; Boyko, Teak D.; Rudel, Stefan S. et al. (2021). Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN2. Journal of Physical Chemistry C . 10.1021/acs.jpcc.1c08115. REIXS, VLS-PGM Materials