Publication Beamlines Strategic Pillar
He, Peng; Jarvis, Jack S.; Meng, Shijun; Li, Qingyin; Bernard, Guy M. et al. (2019). Co-aromatization of methane with propane over Zn/HZSM-5: The methane reaction pathway and the effect of Zn distribution. Applied Catalysis B: Environmental 250, 99-111. 10.1016/j.apcatb.2019.03.011. SGM, SM Materials
Ma, Limei; Zhang, Xiangzhi; Xu, Zijian; Späth, Andreas; Xing, Zhenjiang et al. (2019). Three-dimensional focal stack imaging in scanning transmission X-ray microscopy with an improved reconstruction algorithm. Optics Express 27(5) , 7787. 10.1364/oe.27.007787. SM Materials
Martens, Isaac; Melo, Lis G. A.; Wilkinson, David P.; Bizzotto, Dan; Hitchcock, Adam P. et al. (2019). Characterization of X-ray Damage to Perfluorosulfonic Acid Using Correlative Microscopy. Journal of Physical Chemistry C 123(26) . 10.1021/acs.jpcc.9b03924. SM Materials
Melo, Lis G.A.; Hitchcock, Adam P. (2019). Electron beam damage of perfluorosulfonic acid studied by soft X-ray spectromicroscopy. Micron 121, 8-20. 10.1016/j.micron.2019.02.006. SM Materials
Zhang, Weiwei; Melo, Lis G. de A.; Hitchcock, Adam P.; Bassim, Nabil (2019). Electron beam damage of epoxy resin films studied by scanning transmission X-ray spectromicroscopy. Micron 120, 74-79. 10.1016/j.micron.2019.02.003. SM Materials
Lai, Y.; Bone, S. E.; Minasian, S.; Ferrier, M. G.; Lezama-Pacheco, J. et al. (2018). Ferromagnetic quantum critical point in CePd2P2 with Pd → Ni substitution. Physical Review B - Condensed Matter and Materials Physics 97(22) , 224406:1-9. 10.1103/physrevb.97.224406. SM Materials
Melo, Lis G. A.; Hitchcock, Adam P.; Susac, Darija; Stumper, Juergen; Berejnov, Viatcheslav et al. (2018). Effect of UV radiation damage in air on polymer film thickness, studied by soft X-ray spectromicroscopy. Physical Chemistry Chemical Physics 20(24) , 16625-16640. 10.1039/c7cp08621k. SM Materials
Stavinoha, Macy; Cooley, Joya A.; Minasian, Stefan G.; McQueen, Tyrel M.; Kauzlarich, Susan M. et al. (2018). Charge density wave behavior and order-disorder in the antiferromagnetic metallic seriesEu(Ga1−xAlx)4. Physical Review B - Condensed Matter and Materials Physics 97(19) , 195146. 10.1103/physrevb.97.195146. SM Materials
Wu, Juan; Zhu, Xiaohui; West, Marcia M.; Tyliszczak, Tolek; Shiu, Hung-Wei et al. (2018). High-Resolution Imaging of Polymer Electrolyte Membrane Fuel Cell Cathode Layers by Soft X-ray Spectro-Ptychography. Journal of Physical Chemistry C 122(22) , 11709-11719. 10.1021/acs.jpcc.8b02933. SM Materials
Yan, Z. Blossom; Hayes, Robin; Melo, Lis G. A.; Goward, Gillian R.; Hitchcock, Adam P. et al. (2018). X-ray Absorption and Solid-State NMR Spectroscopy of Fluorinated Proton Conducting Polymers. Journal of Physical Chemistry C 122(6) , 3233-3244. 10.1021/acs.jpcc.7b11592. SM Materials
Andrews, Justin L.; De Jesus, Luis R.; Tolhurst, Thomas M.; Marley, Peter M.; Moewes, Alexander et al. (2017). Intercalation-Induced Exfoliation and Thickness-Modulated Electronic Structure of a Layered Ternary Vanadium Oxide. Chemistry of Materials 29(7) , 3285-3294. 10.1021/acs.chemmater.7b00597. CLS-APS, SGM, SM Materials
Cheng, C.; Cao, W.; Bailey, W.E. (2017). Phase-resolved imaging of edge-mode spin waves using scanning transmission x-ray microscopy. Journal of Magnetism and Magnetic Materials 424, 12-15. 10.1016/j.jmmm.2016.09.096. SM Materials
De Jesus, Luis R.; Zhao, Ying; Horrocks, Gregory A.; Andrews, Justin L.; Stein, Peter et al. (2017). Lithiation across interconnected V2O5 nanoparticle networks. Journal of Materials Chemistry A 5(38) , 20141-20152. 10.1039/c7ta04892k. SM Materials
Horrocks, Gregory A.; De Jesus, Luis R.; Andrews, Justin L.; Banerjee, Sarbajit (2017). X-ray Spectroscopy and Imaging as Multiscale Probes of Intercalation Phenomena in Cathode Materials. JOM 69(9) , 1469-1477. 10.1007/s11837-017-2398-3. REIXS, SM Materials
Nho, Hyun Woo; Yoon, Tae Hyun (2017). Structural colour of unary and binary colloidal crystals probed by scanning transmission X-ray microscopy and optical microscopy. Scientific Reports 7(1) , 12424:1-10. 10.1038/s41598-017-12831-4. SM Materials