| Morin Caamano, Tatiana; Houache, Mohamed S. E.; Couillard, Martin; Turnbull, Matthew; Zhou, Jigang et al. (2023). Plasmon-Enhanced Co2 Electroreduction on Copper, Silver, and Copper-Silver Nano-Electrocatalysts. Patent Number: 10.2139/ssrn.4592365. |
SM, SXRMB |
Conference Proceeding |
Materials |
| Park, J (2019). STXM Study on Layered Nanomaterials: Graphene & TMD. Microscopy and Microanalysis 25(S2) , 2102-2103. 10.1017/s1431927619011243. |
SM |
Conference Proceeding |
Materials |
| Melo, Lis G.A.; Hitchcock, Adam P. (2018). Optimizing Soft X-ray Spectromicroscopy for Fuel Cell Studies: X-ray Damage of Ionomer.. Microscopy and Microanalysis 24(S2) , 460-461. 10.1017/s1431927618014538. |
SM |
Conference Proceeding |
Materials |
| Berejnov, Viatcheslav; Saha, Madhu; Susac, Darija; Stumper, Juergen; West, Marcia et al. (2017). Advances in Structural Characterization Using Soft X-ray Scanning Transmission Microscopy (STXM): Mapping and Measuring Porosity in PEM-FC Catalyst Layers. ECS Transactions 80(8) , 241-252. 10.1149/08008.0241ecst. |
SM |
Conference Proceeding |
Materials |
| G. A. Melo, Lis; Hitchcock, Adam P; Jankovic, Jasna; Stumper, Jürgen; Susac, Darija et al. (2017). Quantitative Mapping of Ionomer in Catalyst Layers by Electron and X-ray Spectromicroscopy. ECS Transactions 80(8) , 275-282. 10.1149/08008.0275ecst. |
SM |
Conference Proceeding |
Materials |
| de A. Melo, Lis G.; Botton, G.A.; Hitchcock, Adam P. (2015). Quantification of the critical dose for radiation damage to perfluorosulfonic acid membranes using soft X-ray microscopy. Microscopy and Microanalysis 21(S3) , 2443-2444. 10.1017/s1431927615012994. |
SM |
Conference Proceeding |
Materials |