Publication Beamlines Strategic Pillar
Hitchcock, Adam P.; Krüger, Peter; Bittencourt, Carla; Swerhone, George D.W.; Lawrence, John R. et al. (2019). Spatially Resolved Soft X-ray Spectroscopy in Scanning X-ray Microscopes. Microscopy and Microanalysis 25(S2) , 254-255. 10.1017/s1431927619002009. SM Environment
Park, J (2019). STXM Study on Layered Nanomaterials: Graphene & TMD. Microscopy and Microanalysis 25(S2) , 2102-2103. 10.1017/s1431927619011243. SM Materials