Publication Beamlines Strategic Pillar
Zhang, Chunyang; Eraky, Haytham; Ingino, Pablo; Obst, Martin; Wang, Jian et al. (2023). In-situ STXM characterization of Cu/Cu2O electrocatalysts for CO2 reduction. AIP Conference Proceedings . 10.1063/5.0168124. SM Materials
Geilhufe, J.; Leontowich, A. F. G.; Wang, J.; Berg, R.; Regier, C. N. et al. (2018). Soft X-ray Spectrotomographic Microscopy at Cryogenic Temperatures. Microscopy and Microanalysis 24(S2) , 260-261. 10.1017/s1431927618013648. SM Materials
Kolmakov, Andrei; Strelcov, Evgheni; Guo, Hongxuan; Yulaev, Alexander; Hoskins, Brian et al. (2018). Graphene windows enable photoelectron microscopies of liquid samples.. Microscopy and Microanalysis 24(S2) , 68-71. 10.1017/s1431927618012746. SM Materials
Stuckelberger, M. E.; Nietzold, T.; West, B. M.; Walker, T.; Ossig, C. et al. (2018). Challenges and Opportunities with Highly Brilliant X-ray Sources for multi-Modal in-Situ and Operando Characterization of Solar Cells. Microscopy and Microanalysis 24(S2) , 434-435. 10.1017/s1431927618014423. SM Materials
Wang, Jian (2018). Applications of Soft X-ray Spectromicroscopies to Lithium Ion Battery Analysis. Microscopy and Microanalysis 24(S2) , 416-419. 10.1017/s1431927618014356. SM Materials
Wang, Jian; Jan Geilhufe,; Lu, Yingshen; Dynes, James J.; Zhou, Jigang et al. (2018). Soft X-ray Spectromicroscopy at the Canadian Light Source. Microscopy and Microanalysis 24(S2) , 230-231. 10.1017/s1431927618013491. SM Materials
Wang, Zhiqiang; Wang, Jian; Hou, Dejian; Sham, Tsun-Kong (2018). Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials. Microscopy and Microanalysis 24(S2) , 480-481. 10.1017/s1431927618014630. SGM, SM Materials
Yang, Jianjun; Wang, Jian (2018). Submicron Distribution and Association of Copper and Organic Carbon in A Contaminated Soil Using Scanning Transmission X-ray Microspectroscopy. Microscopy and Microanalysis 24(S2) , 512-513. 10.1017/s1431927618014782. SM Environment
Leontowich, A F G; Taylor, D M; Wang, J; Regier, C N; Regier, T Z et al. (2017). Low background, UHV compatible scintillator detector for the CLS cryo scanning soft X-ray microscope. Journal of Physics: Conference Series 849, 012045. 10.1088/1742-6596/849/1/012045. SGM, SM Materials