| Bassim, ND; DeGregoio, BT; Stroud, RM; Fischione, PE (2008). Study of FIB Damage in Carbonaceous Materials using XANES. Microscopy and Microanalysis 14(S2) , 1008-1009. 10.1017/s1431927608084869. |
SM |
Peer-Reviewed Article |
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| Greiner, Mark T.; Festin, Miguel; Kruse, Peter (2008). Investigation of Corrosion-Inhibiting Aniline Oligomer Thin Films on Iron Using Photoelectron Spectroscopy. Journal of Physical Chemistry C 112(48) , 18991-19004. 10.1021/jp805533v. |
SM, VLS-PGM |
Peer-Reviewed Article |
Materials |
| Hale, Penelope; Turgeon, Stéphane; Horny, Paula; Lewis, François; Brack, Narelle et al. (2008). X-ray Photoelectron Emission Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry Analysis of Ultrathin Fluoropolymer Coatings for Stent Applications. Langmuir 24(15) , 7897-7905. 10.1021/la8002788. |
SGM, SM |
Peer-Reviewed Article |
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| Hitchcock, Adam P.; Dynes, James J.; Johansson, Göran; Wang, Jian; Botton, Gianluigi et al. (2008). Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter. Micron 39(6) , 741-748. 10.1016/j.micron.2007.09.010. |
SM |
Peer-Reviewed Article |
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| Kaznatcheev, K.V.; Karunakaran, Ch.; Lanke, U.D.; Urquhart, S.G.; Obst, M. et al. (2007). Soft X-ray spectromicroscopy beamline at the CLS: Commissioning results. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 96-99. 10.1016/j.nima.2007.08.083. |
SM |
Peer-Reviewed Article |
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