Publication Beamlines Strategic Pillar
Behyan, S.; Haines, B.; Karanukaran, C.; Wang, J.; Obst, M. et al. (2011). Surface Detection in a STXM Microscope. AIP Conference Proceedings , 184-187. 10.1063/1.3625335. SM
Kaznatcheev, K.; Bertwistle, D.; Cheng, C.; Zohar, S.; Bailey, W. E. et al. (2011). Synchronous (Lock‐in) Measurement Techniques for Magnetic Contrast Enhancement in STXM. AIP Conference Proceedings , 333-336. 10.1063/1.3625372. SM
Wang, J.; Hitchcock, A. P.; Karunakaran, C.; Prange, A.; Franz, B. et al. (2011). 3D Chemical and Elemental Imaging by STXM Spectrotomography. AIP Conference Proceedings , 215-218. 10.1063/1.3625342. SM
Karunakaran; C.; Bouchet; B.; Gaillard et al. (2010). Analyse de surfaces biologiques par microscopie a balayage par transmission de rayons X mous. In Materiaux2010. . . SM
Najafi, Ebrahim; Cruz, Daniel Hernández; Obst, Martin; Hitchcock, Adam P; Felten, Alexandre et al. (2009). Scanning transmission X-ray microscopy of multi-walled carbon nanotubes. Journal of Physics: Conference Series 186, 012106. 10.1088/1742-6596/186/1/012106. SM
Kaznacheyev; K.; Blomqvist; I.; Hallin et al. (2004). Principles of optical design of the SM beamline at the CLS. Patent Number: 10.1063/1.1758040. SM