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Publication | Beamlines | Type | Strategic Pillar |
---|---|---|---|
Felten, Alexandre; Gillon, Xavier; Gulas, Michal; Pireaux, Jean-Jacques; Ke, Xiaoxing et al. (2010). Measuring Point Defect Density in Individual Carbon Nanotubes Using Polarization-Dependent X-ray Microscopy. ACS Nano 4(8) , 4431-4436. 10.1021/nn1002248. | SM | Peer-Reviewed Article | |
Zhou, J. G.; Wang, J.; Sun, C. L.; Maley, J. M.; Sammynaiken, R. et al. (2011). Nano-scale chemical imaging of a single sheet of reduced graphene oxide. Journal of Materials Chemistry 21(38) , 14622. 10.1039/c1jm11071c. | SM | Peer-Reviewed Article |