| Behyan, S. (2013). Development of Surface Sensitivity in Scanning X-ray Microscopy and NEXAFS Spectroscopy of Organosulphur Compounds. Canada, SK: University of Saskatchewan. . |
SM, SXRMB |
Doctoral Thesis |
|
| Farvid, Shokouh S.; Hegde, Manu; Radovanovic, Pavle V. (2013). Influence of the Host Lattice Electronic Structure on Dilute Magnetic Interactions in Polymorphic Cr(III)-Doped In2O3 Nanocrystals. Chemistry of Materials 25(2) , 233-244. 10.1021/cm303317t. |
HXMA, SM, SXRMB |
Peer-Reviewed Article |
|
| Walker; T. (2011). Authentic scientific inquiry, student engagement and transformational learning: are they related?. Canada, SK: CLS. https://harvest.usask.ca/bitstream/handle/10388/ETD-2011-09-224/ThesisVersionFinalFormatJan2012.pdf?sequence=5. |
BMIT-BM, FAR-IR, HXMA, MID-IR, SGM, SM, SXRMB, VESPERS, VLS-PGM |
Masters Thesis |
|
| Christensen, S. (2009). Photoemission Electron Microscopy and Atomic Force Microscopy of Phase-
Separated Langmuir-Blodgett Monolayer Thin Films. Canada, SK: University of Saskatchewan. . |
SM, VLS-PGM |
Masters Thesis |
|
| Greiner, M.T. (2007). Investigation of Corrosion Inhibiting Aniline Oligomer Films on Iron Using Photoelectron Spectroscopy. Canada, ON: McMaster University. . |
SM, VLS-PGM |
Masters Thesis |
|
| Walker; T. (2011). Authentic scientific inquiry, student engagement and transformational learning: are they related?. Canada, SK: CLS. https://harvest.usask.ca/bitstream/handle/10388/ETD-2011-09-224/ThesisVersionFinalFormatJan2012.pdf?sequence=5. |
BMIT-BM, FAR-IR, HXMA, MID-IR, SGM, SM, SXRMB, VESPERS, VLS-PGM |
Masters Thesis |
|
| Liu, Jian; Banis, Mohammad N.; Sun, Qian; Lushington, Andrew; Li, Ruying et al. (2014). Rational Design of Atomic-Layer-Deposited LiFePO4as a High-Performance Cathode for Lithium-Ion Batteries. Advanced Materials 26(37) , 6472-6477. 10.1002/adma.201401805. |
SGM, SM, VLS-PGM |
Peer-Reviewed Article |
|
| Christensen, S. L.; Haines, B. M.; Lanke, U. D.; Paige, M. F.; Urquhart, S. G. et al. (2011). Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM. IBM Journal of Research and Development 55(4) , 5:1-5:6. 10.1147/jrd.2011.2143550. |
SGM, SM, VLS-PGM |
Peer-Reviewed Article |
|