Publication Beamlines Strategic Pillar
Leontowich, Adam F. G.; Tyliszczak, Tolek; Hitchcock, Adam P. (2011). Measurement of the point spread function of a soft x-ray microscope by single pixel exposure of photoresists. In Damage to VUV, EUV, and X-ray Optics III. SPIE. 9780819486677. SM
Smit, Emiel de; Creemer, J Fredrik; Zandbergen, Henny W; Weckhuysen, Bert M; Groot, Frank M F de et al. (2009). In-situ Scanning Transmission X-ray Microscopy of catalytic materials under reaction conditions. Journal of Physics: Conference Series 190, 012161. 10.1088/1742-6596/190/1/012161. SM
Saha, Madhu S; Tam, Mickey; Berejnov, Viatcheslav; Susac, Darija; McDermid, Scott et al. (2013). Characterization and Performance of Catalyst Layers Prepared by Inkjet Printing Technology. ECS Transactions 58(1) , 797-806. 10.1149/05801.0797ecst. SM
Lee, Vincent; Susac, Darija; Kundu, Sumit; Berejnov, Viatcheslav; Atanasoski, Radoslav T et al. (2013). STXM Characterization of Nanostructured Thin Film Anode Before and After Start-Up Shutdown and Reversal Tests. ECS Transactions 58(1) , 473-479. 10.1149/05801.0473ecst. SM