Publication Beamlines Strategic Pillar
Hu, Y.F.; Piao, H.; Fronheiser, J.; Matocha, K. (2011). Chemical characterization of SiO2/SiC interface after nitridation treatment. Journal of Electron Spectroscopy and Related Phenomena 184(3-6) , 245-248. 10.1016/j.elspec.2010.09.005. SXRMB
Lee, Kee Eun; Gomez, Mario A.; Regier, Tom; Hu, Yongfeng; Demopoulos, George P. et al. (2011). Further Understanding of the Electronic Interactions between N719 Sensitizer and Anatase TiO2 Films: A Combined X-ray Absorption and X-ray Photoelectron Spectroscopic Study. Journal of Physical Chemistry C 115(13) , 5692-5707. 10.1021/jp109869z. SGM, SXRMB
Li, Y.S.; Pan, T.J.; Tang, Y.; Yang, Q.; Hirose, A. et al. (2011). Selective synthesis of diamond and CNT nanostructures directly on stainless steel substrates. Diamond and Related Materials 20(2) , 187-190. 10.1016/j.diamond.2010.11.027. SGM, SXRMB, VESPERS
Li, Y.S.; Yang, L.; Tang, Y.; Zhang, C.; Zhang, L. et al. (2011). Adherent nanocrystalline diamond coatings deposited on Ti substrate at moderate temperatures. Surface and Coatings Technology 206(7) , 1971-1976. 10.1016/j.surfcoat.2011.09.077. REIXS, SXRMB, VESPERS
Mourhatch, Ramoun; Aswath, Pranesh B. (2011). Tribological behavior and nature of tribofilms generated from fluorinated ZDDP in comparison to ZDDP under extreme pressure conditions—Part II: Morphology and nanoscale properties of tribofilms. Tribology International 44(3) , 201-210. 10.1016/j.triboint.2010.10.035. SGM, SXRMB, VLS-PGM
Sigrist, Jessica A.; Walker, James D.S.; Hayes, John R.; Gaultois, Michael W.; Grosvenor, Andrew P. et al. (2011). Determining the effect of Ru substitution on the thermal stability of CeFe4−xRuxSb12. Solid State Sciences 13(11) , 2041-2048. 10.1016/j.solidstatesciences.2011.09.008. SXRMB
Surisetty, Venkateswara Rao; Hu, Yongfeng; Dalai, Ajay Kumar; Kozinski, Janusz (2011). Structural characterization and catalytic performance of alkali (K) and metal (Co and Rh)-promoted MoS2 catalysts for higher alcohols synthesis. Applied Catalysis A: General 392(1-2) , 166-172. 10.1016/j.apcata.2010.11.006. SXRMB
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials
Gebauer, Denis; Gunawidjaja, Philips N.; Ko, J. Y. Peter; Bacsik, Zoltán; Aziz, Baroz et al. (2010). Proto-Calcite and Proto-Vaterite in Amorphous Calcium Carbonates. Angewandte Chemie - International Edition 49(47) , 8889-8891. 10.1002/anie.201003220. SGM, SXRMB
Han, Wei-Qiang; Su, Dong; Murphy, Michael; Ward, Matthew; Sham, Tsun-Kong et al. (2010). Microstructure and electronic behavior of PtPd@Pt core-shell nanowires. Journal of Materials Research 25(4) , 711-717. 10.1557/jmr.2010.0090. SXRMB
Kim, BoHoon; Mourhatch, Ramoun; Aswath, Pranesh B. (2010). Properties of tribofilms formed with ashless dithiophosphate and zinc dialkyl dithiophosphate under extreme pressure conditions. Wear 268(3-4) , 579-591. 10.1016/j.wear.2009.10.004. SGM, SXRMB, VLS-PGM Materials
Kuneš, J.; Baldassarre, L.; Schächner, B.; Rabia, K.; Kuntscher, C. A. et al. (2010). Metal-insulator transition inNiS2−xSex. Physical Review B - Condensed Matter and Materials Physics 81(3) . 10.1103/physrevb.81.035122. SXRMB
MacDonald, Mark A.; Zhang, Peng; Chen, Ning; Qian, Huifeng; Jin, Rongchao et al. (2010). Solution-Phase Structure and Bonding of Au38(SR)24 Nanoclusters from X-ray Absorption Spectroscopy. Journal of Physical Chemistry C 115(1) , 65-69. 10.1021/jp1102884. HXMA, SXRMB
MacDonald, Mark A.; Zhang, Peng; Qian, Huifeng; Jin, Rongchao (2010). Site-Specific and Size-Dependent Bonding of Compositionally Precise Gold−Thiolate Nanoparticles from X-ray Spectroscopy. Journal of Physical Chemistry Letters 1(12) , 1821-1825. 10.1021/jz100547q. HXMA, SGM, SXRMB, VLS-PGM Materials
Sklad, Alina C.; Gaultois, Michael W.; Grosvenor, Andrew P. (2010). Examination of CeFe4Sb12 upon exposure to air: Is this material appropriate for use in terrestrial, high-temperature thermoelectric devices?. Journal of Alloys and Compounds 505(1) , L6-L9. 10.1016/j.jallcom.2010.05.167. HXMA, SXRMB