Publication Beamlines Strategic Pillar
Abad, Manuel D.; Veldhuis, Stephen C.; Endrino, Jose L.; Beake, Ben D.; García-Luis, Alberto et al. (2014). Mechanical and phase stability of TiBC coatings up to 1000 °C. Journal of Vacuum Science and Technology A: Vacuum. Surfaces and Films 32(2) , 021508. 10.1116/1.4861365. VLS-PGM Materials
AbdulHalim, Lina G.; Ashraf, Sumaira; Katsiev, Khabiboulakh; Kirmani, Ahmad R.; Kothalawala, Nuwan et al. (2013). A scalable synthesis of highly stable and water dispersible Ag44(SR)30 nanoclusters. Journal of Materials Chemistry 1(35) , 10148. 10.1039/c3ta11785e. VLS-PGM Materials
Adsetts, Jonathan Ralph; Hoesterey, Salena; Love, David A; Ding, Zhifeng (2020). Structural origins of carbon quantum dot luminescence by synchrotron x-ray spectroscopy. Electronic Structure 2(4) , 044004. 10.1088/2516-1075/abd61c. SGM, VLS-PGM Materials
Adsetts, Jonathan Ralph; Hoesterey, Salena; Love, David A; Ding, Zhifeng (2020). Structural origins of carbon quantum dot luminescence by synchrotron x-ray spectroscopy. Electronic Structure 2(4) , 044004. 10.1088/2516-1075/abd61c. SGM, VLS-PGM Materials
Amin, M. Ruhul; de Boer, T.; Becker, Peter; Hertrampf, Jan; Niewa, Rainer et al. (2019). Bandgap and Electronic Structure Determination of Oxygen-Containing Ammonothermal InN: Experiment and Theory. Journal of Physical Chemistry C 123(14) , 8943-8950. 10.1021/acs.jpcc.8b12369. REIXS, VLS-PGM Materials
Amin, M. Ruhul; de Boer, T.; Becker, Peter; Hertrampf, Jan; Niewa, Rainer et al. (2019). Bandgap and Electronic Structure Determination of Oxygen-Containing Ammonothermal InN: Experiment and Theory. Journal of Physical Chemistry C 123(14) , 8943-8950. 10.1021/acs.jpcc.8b12369. REIXS, VLS-PGM Materials
Amin, M. Ruhul; Elzer, Eugenia; Schnick, Wolfgang; Moewes, Alexander (2021). Unraveling the Energy Levels of Eu2+ Ions in MBe20N14:Eu2+ (M = Sr, Ba) Phosphors. Journal of Physical Chemistry C 125(22) , 11828-11837. 10.1021/acs.jpcc.1c01085. REIXS, VLS-PGM Materials
Amin, M. Ruhul; Elzer, Eugenia; Schnick, Wolfgang; Moewes, Alexander (2021). Unraveling the Energy Levels of Eu2+ Ions in MBe20N14:Eu2+ (M = Sr, Ba) Phosphors. Journal of Physical Chemistry C 125(22) , 11828-11837. 10.1021/acs.jpcc.1c01085. REIXS, VLS-PGM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Effects of rare-earth substitution in the oxyarsenides REFeAsO (RE=Ce, Pr, Nd, Sm, Gd) and CeNiAsO by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1477-1483. 10.1016/j.jssc.2010.04.010. VLS-PGM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials
Boesenberg, Ulrike; Marcus, Matthew A.; Shukla, Alpesh K.; Yi, Tanghong; McDermott, Eamon et al. (2014). Asymmetric pathways in the electrochemical conversion reaction of NiO as battery electrode with high storage capacity. Scientific Reports 4(1) , 7133. 10.1038/srep07133. VLS-PGM Materials
Cao, Chuntian; Toney, Michael F.; Sham, Tsun-Kong; Harder, Ross; Shearing, Paul R. et al. (2020). Emerging X-ray imaging technologies for energy materials. Materials Today 34, 132-147. 10.1016/j.mattod.2019.08.011. SGM, SXRMB, VLS-PGM Materials
Cao, Chuntian; Toney, Michael F.; Sham, Tsun-Kong; Harder, Ross; Shearing, Paul R. et al. (2020). Emerging X-ray imaging technologies for energy materials. Materials Today 34, 132-147. 10.1016/j.mattod.2019.08.011. SGM, SXRMB, VLS-PGM Materials
Cao, Chuntian; Toney, Michael F.; Sham, Tsun-Kong; Harder, Ross; Shearing, Paul R. et al. (2020). Emerging X-ray imaging technologies for energy materials. Materials Today 34, 132-147. 10.1016/j.mattod.2019.08.011. SGM, SXRMB, VLS-PGM Materials