Publication Beamlines Strategic Pillar
Christensen, S. L.; Haines, B. M.; Lanke, U. D.; Paige, M. F.; Urquhart, S. G. et al. (2011). Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM. IBM Journal of Research and Development 55(4) , 5:1-5:6. 10.1147/jrd.2011.2143550. SGM, SM, VLS-PGM