Publication Beamlines Strategic Pillar
Banerjee, Neil R.; Van Loon, Lisa L.; Quirt, David (2018). XRF Microscopy and Boron K-edge XANES Analysis of Bulk Rock Samples Associated with Uranium Deposits. Microscopy and Microanalysis 24(S2) , 508-509. 10.1017/s1431927618014769. IDEAS, VLS-PGM Environment