Publication Beamlines Strategic Pillar
Shendruk, T.N.; Moewes, A.; Kurmaev, E.Z.; Ochin, P.; Maury, H. et al. (2010). Interfacial properties and characterization of Sc/Si multilayers. Thin Solid Films 518(14) , 3808-3812. 10.1016/j.tsf.2010.01.036. SGM
Laird, Brian D.; Peak, Derek; Siciliano, Steven D. (2010). The effect of residence time and fluid volume to soil mass (LS) ratio onin vitroarsenic bioaccessibility from poorly crystalline scorodite. Journal of Environmental Science and Health - Part A Toxic/Hazardous Substances and Environmental Engineering 45(6) , 732-739. 10.1080/10934521003648958. HXMA
Thomson, Jordan W.; Cademartiri, Ludovico; MacDonald, Mark; Petrov, Srebri; Calestani, Gianluca et al. (2010). Ultrathin Bi2S3 Nanowires: Surface and Core Structure at the Cluster-Nanocrystal Transition. Journal of the American Chemical Society 132(26) , 9058-9068. 10.1021/ja101908k. HXMA, SXRMB
Najafi, Ebrahim; Wang, Jian; Hitchcock, Adam P.; Guan, Jingwen; Dénommée, Stephane et al. (2010). Characterization of Single-Walled Carbon Nanotubes by Scanning Transmission X-ray Spectromicroscopy: Purification, Order and Dodecyl Functionalization. Journal of the American Chemical Society 132(26) , 9020-9029. 10.1021/ja101001t. SM
Liu, Na; Yu, Peiqiang (2010). Characterization of the Microchemical Structure of Seed Endosperm within a Cellular Dimension among Six Barley Varieties with Distinct Degradation Kinetics, Using Ultraspatially Resolved Synchrotron-Based Infrared Microspectroscopy. Journal of Agricultural and Food Chemistry 58(13) , 7801-7810. 10.1021/jf101233n. MID-IR
Subramanian, Venkat; Achenbach, Sven; Klymyshyn, David; Wells, Garth; Dolton, Wade et al. (2010). In situ diagnostic capabilities for beam position and beam intensity monitoring at SyLMAND. Microsystem Technologies 16(8-9) , 1547-1551. 10.1007/s00542-010-1088-7.
Boyko, T. D.; Bailey, E.; Moewes, A.; McMillan, P. F. (2010). Class of tunable wide band gap semiconductorsγ−(GexSi1−x)3N4. Physical Review B - Condensed Matter and Materials Physics 81(15) . 10.1103/physrevb.81.155207. SGM