Publication Beamlines Strategic Pillar
Zwiebler, M; Hamann-Borrero, J E; Vafaee, M; Komissinskiy, P; Macke, S et al. (2015). Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity. New Journal of Physics 17(8) , 083046. 10.1088/1367-2630/17/8/083046. REIXS