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Abad, Manuel David; Sanjinés, Rosendo; Endrino, Jose Luis; Gago, Raúl; Andersson, Joakim et al. (2011). Identification of Ternary Phases in TiBC/a-C Nanocomposite Thin Films: Influence on the Electrical and Optical Properties. Plasma Processes and Polymers 8(7) , 579-588. 10.1002/ppap.201000182. |
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Abel, Keith A.; Boyer, John-Christopher; Veggel, Frank C. J. M. van (2009). Hard Proof of the NaYF4/NaGdF4 Nanocrystal Core/Shell Structure. Journal of the American Chemical Society 131(41) , 14644-14645. 10.1021/ja906971y. |
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Abel, Keith A.; FitzGerald, Paul A.; Wang, Ting-Yu; Regier, Tom Z.; Raudsepp, Mati et al. (2012). Probing the Structure of Colloidal Core/Shell Quantum Dots Formed by Cation Exchange. Journal of Physical Chemistry C 116(6) , 3968-3978. 10.1021/jp2112928. |
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Abraham, Shibu; Lan, Yaqi; Lam, Ricky S. H.; Grahame, Douglas A. S.; Kim, Jennifer Jae Hee et al. (2012). Influence of Positional Isomers on the Macroscale and Nanoscale Architectures of Aggregates of Racemic Hydroxyoctadecanoic Acids in Their Molecular Gel, Dispersion, and Solid States. Langmuir 28(11) , 4955-4964. 10.1021/la204412t. |
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Achenbach, Sven; Shen, Chen; Wells, Garth (2018). Numerical and experimental thermal analysis of polyimide-based x-ray masks at the Canadian Light Source. Journal of Vacuum Science and Technology B 36(1) , 012001. 10.1116/1.5005115. |
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Achenbach, Sven; Subramanian, Venkat; Klymyshyn, David; Wells, Garth (2010). Synchrotron laboratory for micro and nano devices: facility concept and design. Microsystem Technologies 16(8-9) , 1293-1298. 10.1007/s00542-010-1071-3. |
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Achkar, A. J.; He, F.; Sutarto, R.; Geck, J.; Zhang, H. et al. (2013). Resonant X-Ray Scattering Measurements of a Spatial Modulation of the Cu3dand O2pEnergies in Stripe-Ordered Cuprate Superconductors. Physical Review Letters 110(1) . 10.1103/physrevlett.110.017001. |
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Achkar, A. J.; He, F.; Sutarto, R.; McMahon, Christopher; Zwiebler, M. et al. (2016). Orbital symmetry of charge-density-wave order in La1.875Ba0.125CuO4 and YBa2Cu3O6.67. Nature Materials 15(6) , 616-620. 10.1038/nmat4568. |
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