Publication Beamlines Strategic Pillar
Wang, Jian; Jan Geilhufe,; Lu, Yingshen; Dynes, James J.; Zhou, Jigang et al. (2018). Soft X-ray Spectromicroscopy at the Canadian Light Source. Microscopy and Microanalysis 24(S2) , 230-231. 10.1017/s1431927618013491. SM Materials
Wang, Jian (2018). Applications of Soft X-ray Spectromicroscopies to Lithium Ion Battery Analysis. Microscopy and Microanalysis 24(S2) , 416-419. 10.1017/s1431927618014356. SM Materials
Zuin, Lucia; Wang, Dongniu; Karunakaran, Chithra (2018). Commissioning Results from the newly installed KB Refocusing System for the VLS-PGM Beamline at the Canadian Light Source. Microscopy and Microanalysis 24(S2) , 506-507. 10.1017/s1431927618014757. VLS-PGM Agriculture