Publication Beamlines Strategic Pillar
Jones, Morris E.; Nico, Peter S.; Ying, Samantha; Regier, Tom; Thieme, Jürgen et al. (2018). Manganese-Driven Carbon Oxidation at Oxic–Anoxic Interfaces. Environmental Science & Technology 52(21) , 12349-12357. 10.1021/acs.est.8b03791. SGM Environment
Dynes, James J.; Arthur, Zachary; Read, Stuart; Stobbs, Jarvis; Regier, Tom Z. et al. (2018). Correlative Spectromicroscopy Software Development on the SGM and Mid-IR Beamlines at the CLS. Microscopy and Microanalysis 24(S2) , 494-495. 10.1017/s1431927618014708. MID-IR, SGM Environment
Wang, Zhiqiang; Wang, Jian; Hou, Dejian; Sham, Tsun-Kong (2018). Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials. Microscopy and Microanalysis 24(S2) , 480-481. 10.1017/s1431927618014630. SGM, SM Materials
Zhao, Xiuyun; Niketic, Svetlana; Yim, Chae-Ho; Zhou, Jigang; Wang, Jian et al. (2018). Revealing the Role of Poly(vinylidene fluoride) Binder in Si/Graphite Composite Anode for Li-Ion Batteries. ACS Omega 3(9) , 11684-11690. 10.1021/acsomega.8b01388. SM Materials
Leontowich, A. F. G.; Berg, R.; Regier, C. N.; Taylor, D. M.; Wang, J. et al. (2018). Cryo scanning transmission x-ray microscope optimized for spectrotomography. Review of Scientific Instruments 89(9) , 093704. 10.1063/1.5041009. SM Materials
Kolmakov, Andrei; Strelcov, Evgheni; Guo, Hongxuan; Yulaev, Alexander; Hoskins, Brian et al. (2018). Graphene windows enable photoelectron microscopies of liquid samples.. Microscopy and Microanalysis 24(S2) , 68-71. 10.1017/s1431927618012746. SM Materials
Yang, Jianjun; Wang, Jian (2018). Submicron Distribution and Association of Copper and Organic Carbon in A Contaminated Soil Using Scanning Transmission X-ray Microspectroscopy. Microscopy and Microanalysis 24(S2) , 512-513. 10.1017/s1431927618014782. SM Environment
Stuckelberger, M. E.; Nietzold, T.; West, B. M.; Walker, T.; Ossig, C. et al. (2018). Challenges and Opportunities with Highly Brilliant X-ray Sources for multi-Modal in-Situ and Operando Characterization of Solar Cells. Microscopy and Microanalysis 24(S2) , 434-435. 10.1017/s1431927618014423. SM Materials
Hiraki, Hayato; Liu, Na; Wang, Jian; Stobbs, Jarvis; Karunakaran, Chithra et al. (2018). Soft X-ray Spectromicroscopy: A Versatile Tool to Probe Pristine Plant Cell Walls. Microscopy and Microanalysis 24(S2) , 358-359. 10.1017/s1431927618014071. SM Agriculture
Geilhufe, J.; Leontowich, A. F. G.; Wang, J.; Berg, R.; Regier, C. N. et al. (2018). Soft X-ray Spectrotomographic Microscopy at Cryogenic Temperatures. Microscopy and Microanalysis 24(S2) , 260-261. 10.1017/s1431927618013648. SM Materials
Wang, Zhiqiang; Wang, Jian; Hou, Dejian; Sham, Tsun-Kong (2018). Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials. Microscopy and Microanalysis 24(S2) , 480-481. 10.1017/s1431927618014630. SGM, SM Materials
Wang, Jian; Jan Geilhufe,; Lu, Yingshen; Dynes, James J.; Zhou, Jigang et al. (2018). Soft X-ray Spectromicroscopy at the Canadian Light Source. Microscopy and Microanalysis 24(S2) , 230-231. 10.1017/s1431927618013491. SM Materials
Wang, Jian (2018). Applications of Soft X-ray Spectromicroscopies to Lithium Ion Battery Analysis. Microscopy and Microanalysis 24(S2) , 416-419. 10.1017/s1431927618014356. SM Materials
Fu, Yanqing; Wei, Qiliang; Zhang, Gaixia; Wang, Xiaomin; Zhang, Jihai et al. (2018). High-Performance Reversible Aqueous Zn-Ion Battery Based on Porous MnOxNanorods Coated by MOF-Derived N-Doped Carbon. Advanced Energy Materials 8(26) , 1801445. 10.1002/aenm.201801445. SXRMB, VLS-PGM Materials
Morhart, Tyler A.; Read, Stuart; Wells, Garth; Jacobs, Michael; Rosendahl, Scott M. et al. (2018). Attenuated Total Reflection Fourier Transform Infrared (ATR FT-IR) Spectromicroscopy Using Synchrotron Radiation and Micromachined Silicon Wafers for Microfluidic Applications. Applied Spectroscopy 72(12) , 000370281878564. 10.1177/0003702818785640. MID-IR, SYLMAND Materials